Principles of Semiconductor Network Testing
By Amir Afshar
Publisher: Elsevier / Newnes
Final Release Date: April 1996
Pages: 350

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

  • Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
  • Best new source of information for experienced semiconductor engineers as well as entry-level personnel
  • Eight chapters about semiconductor testing
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