Book description
JMP 12 Quality and Process Methodsfocuses on the Fit Model platform and many of its personalities. Linear and logistic regression, analysis of variance and covariance, and stepwise procedures are covered. Also included are multivariate analysis of variance, mixed models, generalized models, and models based on penalized regression techniques.
Table of contents
- Contents
-
Learn about JMP
- Documentation and Additional Resources
- Formatting Conventions
-
JMP Documentation
- JMP Documentation Library
- Discovering JMP
- Using JMP
- Basic Analysis
- Essential Graphing
- Profilers
- Design of Experiments Guide
- Fitting Linear Models
- Specialized Models
- Multivariate Methods
- Quality and Process Methods
- Reliability and Survival Methods
- Consumer Research
- Scripting Guide
- JSL Syntax Reference
- JMP Help
- Additional Resources for Learning JMP
- Introduction to Quality and Process Methods
-
Control Chart Builder
- Create Control Charts Interactively
- Overview of the Control Chart Builder
- Example of the Control Chart Builder
- Control Chart Types
- Launch the Control Chart Builder
- The Control Chart Builder Window
- Control Chart Builder Options
- Retrieving Limits from a Data Table
- Excluded and Hidden Samples
- Additional Examples of the Control Chart Builder
-
Statistical Details for the Control Chart Builder Platform
- Control Limits for X- and R-charts
- Control Limits for X- and S-charts
- Control Limits for Individual Measurement and Moving Range Charts
- Control Limits for p- and np-charts
- Control Limits for u-charts
- Control Limits for c-charts
- Levey-Jennings Charts
- Control Limits for g-charts
- Control Limits for t-charts
-
Shewhart Control Charts
- Create Variable and Attribute Control Charts
- Overview of the Control Chart Platform
- Example of the Control Chart Platform
- Shewhart Control Chart Types
- Launch the Control Chart Platform
- The Control Chart Report
- Control Chart Platform Options
- Saving and Retrieving Limits
- Excluded, Hidden, and Deleted Samples
- Additional Examples of the Control Chart Platform
-
Statistical Details for the Control Chart Platform
- Control Limits for X- and R-charts
- Control Limits for X- and S-charts
- Control Limits for Individual Measurement, Moving Range, and Median Moving Range Charts
- Control Limits for UWMA Charts
- Control Limits for EWMA Charts
- Control Limits for p- and np-charts
- Control Limits on u-charts
- Control Limits on c-charts
- Levey-Jennings Charts
- Cumulative Sum Control Charts
-
Multivariate Control Charts
- Monitor Multiple Process Characteristics Simultaneously
- Multivariate Control Chart Overview
- Example of a Multivariate Control Chart
- Launch the Multivariate Control Chart Platform
- The Multivariate Control Chart
- Multivariate Control Chart Platform Options
- Additional Examples of Multivariate Control Charts
- Statistical Details for Multivariate Control Charts
-
Measurement Systems Analysis
- Evaluate a Continuous Measurement Process Using the EMP Method
- Overview of Measurement Systems Analysis
- Example of Measurement Systems Analysis
- Launch the Measurement Systems Analysis Platform
- Measurement Systems Analysis Platform Options
- Additional Example of Measurement Systems Analysis
- Statistical Details for Measurement Systems Analysis
-
Variability Gauge Charts
- Evaluate a Continuous Measurement Process Using Gauge R&R
- Overview of Variability Charts
- Example of a Variability Chart
- Launch the Variability/Attribute Gauge Chart Platform
- The Variability Gauge Chart
- Variability Gauge Platform Options
- Additional Examples of Variability Charts
- Statistical Details for Variability Charts
-
Attribute Gauge Charts
- Evaluate a Categorical Measurement Process Using Agreement Measures
- Attribute Gauge Charts Overview
- Example of an Attribute Gauge Chart
- Launch the Variability/Attribute Gauge Chart Platform
- The Attribute Gauge Chart and Reports
- Attribute Gauge Platform Options
- Statistical Details for Attribute Gauge Charts
-
Process Capability
- Measure the Variability of a Process over Time
- Process Capability Platform Overview
- Example of the Process Capability Platform
- Launch the Process Capability Platform
- Entering Specification Limits
- The Process Capability Report
- Process Capability Platform Options
- Additional Examples of the Process Capability Platform
- Statistical Details for the Process Capability Platform
- Capability Analysis
- Pareto Plots
- Cause-and-Effect Diagrams
- References
- Index
Product information
- Title: JMP 12 Quality and Process Methods
- Author(s):
- Release date: March 2015
- Publisher(s): SAS Institute
- ISBN: 9781629594682
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